Is Your Factory Power Source Corrupting Your Product Testing?
This paper describes the use of AC power supplies for product testing. It will also discuss the use of regulated electronic AC power supplies to…
Test Equipment
Optimised M-LVDS solutions for high density systems
Date: Wednesday, September 29, 2021Time: 15:00 CESTDuration: 1 hour Modern distributed computing systems require smaller modules which must communicate more data over faster backplanes. Learn…
μModule Data Acquisition Solution Eases Engineering Challenges for a Diverse Set of Precision Applications
This article presents a few key aspects and technical challenges associated with designing precision data acquisition systems. Analog Devices is leveraging its domain expertise in…
Discover the secrets of UWB based on IEEE 802.15.4z
Available On-Demand The advent of ultra-wideband (UWB) on phones, watches and cars calls for a deeper look at the technology and its impact on test…